QJ 1081-1986 应变式线位移传感器特性与试验规范
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基本信息
| 标准名称： | 应变式线位移传感器特性与试验规范 |
| 中标分类： | 航空、航天 >> 航空器与航天器零部件 >> 传感元件 |
| ICS分类： | 航空器和航天器工程 >> 航空航天用电气设备与系统 |
| 发布日期： | 1986-11-10 |
| 实施日期： | 1987-10-01 |
| 首发日期： | |
| 作废日期： | |
| 出版日期： | |
| 页数： | 19页 |
适用范围
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前言
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目录
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引用标准
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所属分类： 航空 航天 航空器与航天器零部件 传感元件 航空器和航天器工程 航空航天用电气设备与系统
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【英文标准名称】:StandardTestMethodforProof-VoltageTestingofThinSolidElectricalInsulatingMaterials
【原文标准名称】:薄固体电绝缘材料的耐电压测试用标准试验方法
【标准号】:ASTMD1389-2007
【标准状态】:现行
【国别】:
【发布日期】:2007
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:D09.12
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:电缆;电介质测量;电气工程;电绝缘材料;电气绝缘;电气测试;绝缘件;测试;金属线
【英文主题词】:proof-voltagetesting;thinsolidinsulatingmaterials
【摘要】:Occasionaldielectricdefectsmaybefoundincommerciallyavailableandacceptablethinelectricinsulatingmaterials.Moreoftenthannot,thesematerialsareusedinmultiplelayers.Theprobabilitythatoccasionaldielectricweakspotswillcoincidefromlayertolayerisverysmallbutincreaseswiththefrequencyofoccurrenceofthesedefects.Theproof-voltagetestservestoindicatethefrequencyofoccurrenceofdielectricdefectsandfacilitatestheisolationofareaswherethedefectsareexcessive.Someusesofthinelectricalinsulatingmaterialsrequirethecompleteabsenceofanydielectricdefects.Theproof-voltagetestservestolocatedielectricdefects,makingpossiblerepairorreplacementoftheareainvolvedasmaybedesirable.Intheabsenceofdetectedfaults,thistestmethodisnondestructivetothematerialbeingevaluated,exceptasdiscussedin1.2and4.3.Acriticalpartoftheapparatusandprocedureisthesensitivityandspeedofresponseofthefaultdetectiondevice.Thelatterisusuallyacircuitbreaker.Dependinguponthecharacteristicsofthislattercomponent,itisverylikelythattheresultsobtainedusingdifferentsetsofapparatuswillexhibitsignificantvariability.Itisessentialthatthefaultdetectorrespondonlytofaultcurrentsandthatfaultcurrentsaboveapre-definedvaluealwaysresultinafaultdetectorresponse.Thedesign,adjustment,andoperationoftheapparatusmustavoidbotherroneousfunctioningandanyerroneousnonfunctioningofthefaultdetectorthatmightbetheresultofchargingcurrents,imbalanceofimpedance,orcomponentmalfunction.Theproof-voltagetesthasbeenusedasamanufacturingcontroltestandasanacceptancetesttoguaranteeaminimumlevelofdielectricdefects.Ifthistestmethodisusedasanacceptancetest,takecarethatthefactorsdiscussedin5.4and5.5havebeenconsidered,andifmorethanonesetofapparatusistobeused,thatcomparableresultsareobtainedfromthem.1.1Thistestmethodcoversageneralprocedureforproof-voltagetestingofthinsolidelectricalinsulatingmaterialsatcommercialpowerfrequencies.Itisintendedtoapplyprincipallytoflatmaterialsbutisapplicable,withmodification,toanyformthatpermitscontinuouslypassingthematerialbetweensuitableelectrodes.,1.2Onextremelythinmaterials(usuallylessthan0.05mm(0.002in.)),thetestresultsmaybeinfluencedmorebymechanicaldamagecausedbyconditionsoftestthanbydielectricdefects.Consequently,thistestmethodisnotrecommendedforusewithextremelythinmaterials,unlesspriordeterminationhasestablishedthatthetestresultsarenotinfluencedbymechanicaldamage.1.3Whiletheequipmentandproceduresdescribedinthistestmethodrelatespecificallytotestsmadewithpowerfrequencyacvoltages,similarequipmentandproceduresareusedforproof-voltagetestsusingdcvoltages.Totheextentthatitappliestodctests,thistestmethodcanserveasaguideforpersonsmakingsuchtests.However,onlytestsmadewithpowerfrequencyacvoltagescanbesaidtobeinaccordancewiththistestmethod.Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.Forspecifichazardstatements,seeSection7.
【中国标准分类号】:K15
【国际标准分类号】:29_035_20
【页数】:4P.;A4
【正文语种】:
【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Part11:Rapidchangeoftemperature;Two-fluid-bathmethod(IEC60749-11:2002);GermanversionEN60749-11:2002
【原文标准名称】:半导体器件.机械和气候试验方法.第11部分:温度骤变.双液电镀槽法
【标准号】:DINEN60749-11-2003
【标准状态】:现行
【国别】:德国
【发布日期】:2003-04
【实施或试行日期】:2003-04-01
【发布单位】:德国标准化学会(DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:电学测量;机械试验;电子设备及元件;环境试验;半导体器件;破坏试验;温度变化;集成电路;气候试验;电子工程;定义;电气工程;气候;试验;半导体;元部件
【英文主题词】:
【摘要】:
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:10P;A4
【正文语种】:德语
【原文标准名称】:薄固体电绝缘材料的耐电压测试用标准试验方法
【标准号】:ASTMD1389-2007
【标准状态】:现行
【国别】:
【发布日期】:2007
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:D09.12
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:电缆;电介质测量;电气工程;电绝缘材料;电气绝缘;电气测试;绝缘件;测试;金属线
【英文主题词】:proof-voltagetesting;thinsolidinsulatingmaterials
【摘要】:Occasionaldielectricdefectsmaybefoundincommerciallyavailableandacceptablethinelectricinsulatingmaterials.Moreoftenthannot,thesematerialsareusedinmultiplelayers.Theprobabilitythatoccasionaldielectricweakspotswillcoincidefromlayertolayerisverysmallbutincreaseswiththefrequencyofoccurrenceofthesedefects.Theproof-voltagetestservestoindicatethefrequencyofoccurrenceofdielectricdefectsandfacilitatestheisolationofareaswherethedefectsareexcessive.Someusesofthinelectricalinsulatingmaterialsrequirethecompleteabsenceofanydielectricdefects.Theproof-voltagetestservestolocatedielectricdefects,makingpossiblerepairorreplacementoftheareainvolvedasmaybedesirable.Intheabsenceofdetectedfaults,thistestmethodisnondestructivetothematerialbeingevaluated,exceptasdiscussedin1.2and4.3.Acriticalpartoftheapparatusandprocedureisthesensitivityandspeedofresponseofthefaultdetectiondevice.Thelatterisusuallyacircuitbreaker.Dependinguponthecharacteristicsofthislattercomponent,itisverylikelythattheresultsobtainedusingdifferentsetsofapparatuswillexhibitsignificantvariability.Itisessentialthatthefaultdetectorrespondonlytofaultcurrentsandthatfaultcurrentsaboveapre-definedvaluealwaysresultinafaultdetectorresponse.Thedesign,adjustment,andoperationoftheapparatusmustavoidbotherroneousfunctioningandanyerroneousnonfunctioningofthefaultdetectorthatmightbetheresultofchargingcurrents,imbalanceofimpedance,orcomponentmalfunction.Theproof-voltagetesthasbeenusedasamanufacturingcontroltestandasanacceptancetesttoguaranteeaminimumlevelofdielectricdefects.Ifthistestmethodisusedasanacceptancetest,takecarethatthefactorsdiscussedin5.4and5.5havebeenconsidered,andifmorethanonesetofapparatusistobeused,thatcomparableresultsareobtainedfromthem.1.1Thistestmethodcoversageneralprocedureforproof-voltagetestingofthinsolidelectricalinsulatingmaterialsatcommercialpowerfrequencies.Itisintendedtoapplyprincipallytoflatmaterialsbutisapplicable,withmodification,toanyformthatpermitscontinuouslypassingthematerialbetweensuitableelectrodes.,1.2Onextremelythinmaterials(usuallylessthan0.05mm(0.002in.)),thetestresultsmaybeinfluencedmorebymechanicaldamagecausedbyconditionsoftestthanbydielectricdefects.Consequently,thistestmethodisnotrecommendedforusewithextremelythinmaterials,unlesspriordeterminationhasestablishedthatthetestresultsarenotinfluencedbymechanicaldamage.1.3Whiletheequipmentandproceduresdescribedinthistestmethodrelatespecificallytotestsmadewithpowerfrequencyacvoltages,similarequipmentandproceduresareusedforproof-voltagetestsusingdcvoltages.Totheextentthatitappliestodctests,thistestmethodcanserveasaguideforpersonsmakingsuchtests.However,onlytestsmadewithpowerfrequencyacvoltagescanbesaidtobeinaccordancewiththistestmethod.Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.Forspecifichazardstatements,seeSection7.
【中国标准分类号】:K15
【国际标准分类号】:29_035_20
【页数】:4P.;A4
【正文语种】:
【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Part11:Rapidchangeoftemperature;Two-fluid-bathmethod(IEC60749-11:2002);GermanversionEN60749-11:2002
【原文标准名称】:半导体器件.机械和气候试验方法.第11部分:温度骤变.双液电镀槽法
【标准号】:DINEN60749-11-2003
【标准状态】:现行
【国别】:德国
【发布日期】:2003-04
【实施或试行日期】:2003-04-01
【发布单位】:德国标准化学会(DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:电学测量;机械试验;电子设备及元件;环境试验;半导体器件;破坏试验;温度变化;集成电路;气候试验;电子工程;定义;电气工程;气候;试验;半导体;元部件
【英文主题词】:
【摘要】:
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:10P;A4
【正文语种】:德语